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Order PHT1100G-01 by Phase II Leeb "G" Test Block, 590-670 Range - US Mega Store

Phase II . PHT1100G-01

Gallery

Attributes

Brand name, Manufacturer namePhase II
ManufacturerPhase II Phase II Plus
Attribute00, Attribute04Leeb "D" Test Block
Attribute01, Attribute05Round
Attribute02, Attribute06590-670
Attribute03, Attribute07For use with "G" impact devices
AttributeKey00, AttributeKey04Description
AttributeKey01, AttributeKey05Shape
AttributeKey02, AttributeKey06Range
AttributeKey03, AttributeKey07Comments
CategoryL1Test Equipment
CategoryL2Hardness Testers
CategoryL3Phase II PHT1100G-01
ConditionNEW
Extra Product NameOrder PHT1100G-01 by Phase II Leeb "G" Test Block, 590-670 Range - US Mega Store
moq, multiple, tierMinQty1, Case, Item_package_quantity, NumberOfItems, Number_of_items, PackageQuantity1
MPN, SKU, Part Number, Model, ModelNumber, Model_number, Mpns, PartNumber, Part_numberPHT1100G-01
qtyInStock-2
qtySourceFieldMap
snippet<p><strong>Leeb "G" Test Block, 590-670 Range </strong> </p>
tierPrice1350.7
Product GroupBISS
ASIN, Asin, KeywordB00BBG0P0M
AdultProduct, Autographed, Memorabilia, TradeInEligibleFalse
Amount275.00
BindingMisc.
Brand, Label, Man, Publisher, StudioPhase II Plus
CatIndustrial & Scientific
CatId16310091
CatTree16310091 16310161 256409011 4989307011
ClassificationId401586011
Currency, CurrencyCodeUSD
DisplayNameHardness Test Blocks
FeatureMinimum Thickness of Sample Coupled: 310mm
FetchTime1567937924 1666577682 1706188625
Height500 75
ItemClassificationBASE_PRODUCT
ItemName, Item_namePhase II PHT1100G-01 Calibrated Leeb Test Block for"G" Probe Impact Device
Item_type_keywordhardness-testing-blocks
Item_weight3.5
Linkhttps://m.media-amazon.com/images/I/31N166NdkAL._SL75_.jpg https://m.media-amazon.com/images/I/31N166NdkAL.jpg
List_price275.0
Marketplace_idATVPDKIKX0DER
ProductGroupBISS BISS Basic
ProductType, ProductTypeNamePRECISION_MEASURING
Product_descriptionPhase II PHT1100G-01 Leeb Test Block for "G" impact device
Product_site_launch_date2013-02-05T00:00:01-08:00
SizeFor "G" Probe Impact Device
StrippedMpnsPHT1100G01
TitlePhase II PHT1100G-01 Calibrated Leeb Test Block for "G" Probe Impact Device Phase II PHT1100G-01 Calibrated Leeb Test Block for"G" Probe Impact Device
TypeEach
URLhttp://ecx.images-amazon.com/images/I/31N166NdkAL._SL75_.jpg https://m.media-amazon.com/images/I/31N166NdkAL._SL75_.jpg
Unitpounds
Unit_count1.0
Unitspixels pounds
VariantMAIN
WebsiteDisplayGroupbiss_basic_display_on_website
WebsiteDisplayGroupNameBISS Basic
Weight1.00 3.5 3.50
Width286 43

Distributor offers

SellerSKUMOQIn stockMultiplePrices
usmegastore.comPHT1100G-011-211 @ $350.70
globaltestsupply.comPHT1100G-0112 to 3 Weeks1
MegadepotPHT1100G-01111 @ $350.00

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Phase II PHT1100G-01 Calibrated Leeb Test Block for"G" Probe Impact Device
Brand: Phase II Plus
Phase II PHT1100G-01 Leeb Test Block for "G" impact device
Listing
BindingMisc.
Product groupBISS
Product typePRECISION_MEASURING
ModelPHT1100G-01
Part numberPHT1100G-01
Items per pack1
LabelPhase II Plus
ManufacturerPhase II Plus
Catalog
FeatureMinimum Thickness of Sample Coupled: 310mm
CategoryIndustrial & Scientific
MPNPHT1100G-01
Product groupBISS
Product typePRECISION_MEASURING
ManufacturerPhase II Plus
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