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KEITHLEY . 2520/KIT1

KEITHLEY . 2520/KIT1

Attributes

Brand name, Manufacturer nameKEITHLEY
ManufacturerKEITHLEY Keithley Instruments, Inc.
extendedQty, qtyInStock0
moq, multiple, Case, Item_package_quantity, NumberOfItems, Number_of_items, PackageQuantity1
MPN, Part Number, Model, ModelNumber, Model_number, PartNumber, Part_number2520/KIT1
qtySourceupdateFromUrlEntry
Product GroupBISS
ASIN, AsinB00C2E2IOS
AdultProduct, Autographed, Batteries_required, Memorabilia, TradeInEligibleFalse
Amount26500.00
BindingMisc.
Brand, Label, Man, Publisher, StudioKeithley Instruments, Inc.
Bullet_pointCombines high accuracy source and measure capabilities for pulsed and DC testing. Measurement algorithm increases the pulse measurement's signal-to-noise ratio Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level. Pulse capability up to 5A, DC capability up to 1A. IEEE-488 and RS-232 interfaces Simplifies laser diode LIV testing prior to packaging or active temperature control. Programmable pulse on time from 500ns to 5ms up to 4% duty cycle. Digital I/O binning and handling operations Sweep can be programmed to stop on optical power limit. 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode) Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements. Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
CatIndustrial & Scientific
CatId16310091
CatTree16310091 16310161
ClassificationId256409011
Currency, CurrencyCodeUSD
DisplayNameTest, Measure & Inspect
FeatureSimplifies laser diode LIV testing prior to packaging or active temperature control. Programmable pulse on time from 500ns to 5ms up to 4% duty cycle. Digital I/O binning and handling operations
FetchTime1568326870 1685367295 1704888864
Height25.4 375 56 9.9999999898
ItemClassificationBASE_PRODUCT
ItemName, Item_name, TitleKeithley 2520/KIT1 Pulsed Laser Diode Measurement Kit (includes 2520, 2520INT, and 3ft.triax cable)
Item_package_weight, Item_weight1.36
Item_type_keywordprecision-measurement-products
KeywordGPIB 1A
Length25.4 9.9999999898
Linkhttps://m.media-amazon.com/images/I/415Lv0uafIL._SL75_.jpg https://m.media-amazon.com/images/I/415Lv0uafIL.jpg
List_price26500.0
Marketplace_idATVPDKIKX0DER
ProductGroupBISS BISS Basic
ProductType, ProductTypeNamePRECISION_MEASURING
Product_descriptionThe Keithley 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Keithley 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-current-voltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
Product_site_launch_date2013-03-27T22:03:24.803Z
URLhttp://ecx.images-amazon.com/images/I/415Lv0uafIL._SL75_.jpg https://m.media-amazon.com/images/I/415Lv0uafIL._SL75_.jpg
Unitcentimeters inches kilograms pounds
Unitsinches pixels pounds
VariantMAIN
WebsiteDisplayGroupbiss_basic_display_on_website
WebsiteDisplayGroupNameBISS Basic
Weight2.9982867632
Width25.4 500 75 9.9999999898

Distributor offers

SellerSKUMOQIn stockMultiplePrices
Newark59T774711
1Source2520/KIT111

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Keithley 2520/KIT1 Pulsed Laser Diode Measurement Kit (includes 2520, 2520INT, and 3ft.triax cable)
Brand: Keithley Instruments, Inc.
The Keithley 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Keithley 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-current-voltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.
Details
  • Simplifies laser diode LIV testing prior to packaging or active temperature control. Programmable pulse on time from 500ns to 5ms up to 4% duty cycle. Digital I/O binning and handling operations
  • Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level. Pulse capability up to 5A, DC capability up to 1A. IEEE-488 and RS-232 interfaces
  • Sweep can be programmed to stop on optical power limit. 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
  • Combines high accuracy source and measure capabilities for pulsed and DC testing. Measurement algorithm increases the pulse measurement's signal-to-noise ratio
  • Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements. Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
Listing
BindingMisc.
Product groupBISS
Product typePRECISION_MEASURING
Model2520/KIT1
Part number2520/KIT1
Items per pack1
LabelKeithley Instruments, Inc.
ManufacturerKeithley Instruments, Inc.
Catalog
FeatureSimplifies laser diode LIV testing prior to packaging or active temperature control. Programmable pulse on time from 500ns to 5ms up to 4% duty cycle. Digital I/O binning and handling operations
CategoryIndustrial & Scientific
MPN2520/KIT1
Product groupBISS
Product typePRECISION_MEASURING
ManufacturerKeithley Instruments, Inc.
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